Showing results: 61 - 75 of 145 items found.
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Applied Image, Inc.
With the amount of applications that optical components have, no one could hope to have the perfect component for every possible scenario. For this reason, APPLIED IMAGE makes easy the process of designing, building, and delivering custom components to our customers. Our engineering process is designed to produce the best parts in the industry and more importantly, the best component for your specific needs. The APPLIED IMAGE experience will cover the project with expert engineers from start to finish. Use the form below to start the conversation for checkerboard and dot arrays, stage and image analysis micrometers, reticles and machine vision components.
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TA Instruments
Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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A222917 -
Chroma ATE Inc.
Chroma A222917 is a multi-functional PCBA main board board signal test device for display. It has ultra high speed LVDS (Low -voltage differential signaling) as image signal analysis core to provide high efficiency and stability test quality.
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Bruker Daltonics
Bruker microCT micro-tomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the sub-micron level. Software for visualization and analysis in 3D is included with all SkyScan systems.
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PiV -
nac Image Technology Inc.
The Invisible® Vision PiV series of multi-frame cameras are designed to achieve ultra fast shuttering combined with zero frame to frame distortion – so essential for quantitative particle image velociometry applications in the analysis and scientific modelling of high speed events.
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CA3008 -
UC Instruments, Corp.
CA3008 Autoget is an intelligent portable fiber enface inspector. with newest hardware and software, and with functions of auto focus, auto exposure,auto analysis, autogenerate report, auto image transmission, etc. Autoget can clearly find out the defects of fiber endface, such dirts, scratches.
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MXI Quadra 7 -
Nordson Corporation
Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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B.O.S.S. -
Newage Testing Instruments, Inc.
The B.O.S.S. brinell optical scanning system measures your brinell impressions faster, more accurately and more consistently. And it improves your quality control with advanced data acquisition and analysis capabilities, including the ability to save your high-resolution image of our impression to file.
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V-Series -
RayClouds Photoelectric Technology Co.,Ltd.
V-Series Virtual Display Analyzer is equipped with high pixel and high resolution detector and detection lens simulating human eye, cooperated with ProICM professional analysis software to analyze the optical characteristics of ARVR equipments. It can accurately detect optical parameters such as luminance, chrominance, contrast, MTF, FOV, image distortion, Cross Talk, ghosting, etc. of the image and quickly output the results of the measured parameters, providing a perfect product testing scheme to carry out strict quality control of ARVR products. ContactContact
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Kratos AXIS Nova -
Shimadzu Corp.
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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JewelBox 70T -
Glenbrook Technologies
The Jewel Box 70-T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system?s high-resolution MXRA® x-ray camera and 10-micron MicroTech? x-ray source provide magnification from 7X to 2000X, with resolution of 100 line pairs/mm.
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Santec Corporation
Santec’s Swept-Source Optical Coherence Tomography System (SS-OCT) provides a complete, flexible solution which can be used for a wide range of applications, both medical and industrial. Components can be selected to optimize the imaging speed, resolution, imaging area and depth for each application. The system is supplied with a graphic user interface (GUI) that controls the scan parameters and displays both cross sectional and 3D images. An API is available as an option, for integration with other equipment and image analysis automation. We also supports the hardware and software customization where appropriate.
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Sydor Technologies
Photek photon-counting camera systems are unique as they provide the ability to capture and integrate an image in real time. These systems are ideal for extremely low photon emission applications such as bio-luminescence, chemi-luminescence and weak fluorescence. The ability to accurately analyze transient events is a key feature of this product. The length of time that the image can be integrated is limited only by disc space, and allows the user to fully capture real-time events. X, Y and time co-ordinates for post acquisition analysis is also recorded. X-ray and vacuum imaging camera options are also available.
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Curtiss Wright IMR Test Labs
The metallurgical group is well equipped and staffed (9 full-time metallurgists and technicians) to evaluate materials ranging from cast iron to superalloys to composites. They are experienced in classical metallographic techniques, as well as the latest preparation methods. Advanced analytical tools such as image analysis and scanning electron microscopy (SEM) are used in their evaluations.